Enhancing the lateral resolution in optical microscopy and interferometry is of great interest in recent research. In order to laterally resolve structures including feature dimensions below the Abbe resolution limit, microspheres in the optical near-field of the specimen are shown to locally improve the resolution of the imaging system. Experimental and simulated results following this approach are obtained by a high NA Linnik interferometer and analyzed in this contribution. They show the reconstructed surface of a 1D phase grating below the resolution limit. For further understanding of the transfer characteristics, measured interference data are compared with FEM (finite element method) based simulations with respect to the polarization dependency of the relevant image information for 1D phase gratings. Therefore, the implemented Koehler illumination as well as the experimental setup utilize polarized light.

为解决采用Au光电阴极、开放式结构的分幅变像管探测效率低、稳定性差的问题，研制了一种采用CsI光电阴极的密封式分幅变像管。为了对比不同光电阴极对X射线的响应强度，密封式分幅变像管制作有一条Au微带阴极和一条CsI微带阴极。完成了密封式分幅变像管的结构设计、工艺制作和实验测试。研究结果表明：当加载半高宽度200 ps、幅值−2.7 kV的选通脉冲时测得其时间分辨为65 ps；在非单色高能X射线源照射下，CsI阴极的静态响应强度是Au阴极的3.4倍；大气环境中存储1000 h后密封式分幅变像管的静态响应强度仅降低到完成制作时的83%。上述结果表明采用CsI阴极的密封式分幅变像管具有更高的探测效率和稳定性，可有效提升X射线分幅成像质量和可靠性。