光学学报, 1999, 19 (11): 1581, 网络出版: 2006-08-09
半导体光电探测器响应度测试装置的研制
A Device for Testing Spectral Responsivity of Semiconductor Photodetector
相对光谱响应度 绝对光谱响应度 量子效率 单色仪 relative spectral response absolute spectral response quantum efficiency monochromater
摘要
分析了半导体光电探测器光谱响应度的测试原理；研制了一套波长为0.4～1.1μm的光谱响应度测试装置。该装置采用双光路替代法,可以测试绝对光谱响应度、相对光谱响应度和量子效率,并可减小光源不稳定性对测试结果的影响,最终给出了测试结果比对。
Abstract
The testing of spectral responsivity of semiconductor photo detector is discussed. A device used for testing spectral responsivity with wavelength ranged from 0.4～1.1 μm is developed. It can be used to test relative spectral responsivity, absolute spectral responsivity and quantum efficiency, and the effect of instability of source can be eliminated. The testing results are compared.
参考文献
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刘晖, 朱日宏, 朱煜, 陈进榜. 半导体光电探测器响应度测试装置的研制[J]. 光学学报, 1999, 19(11): 1581. 刘晖, 朱日宏, 朱煜, 陈进榜. A Device for Testing Spectral Responsivity of Semiconductor Photodetector[J]. Acta Optica Sinica, 1999, 19(11): 1581.
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