为探究双涡旋光干涉图样对微测量精度的影响，基于双涡旋光干涉原理，提出一种测量涡旋光自干涉图样的方法。分析了双涡旋光干涉图像的影响因素，设计并搭建了测量双涡旋光剪切干涉图样特性的光学系统。通过采集同一条件下物体移到不同距离后的双涡旋光干涉图像，利用图像相关法计算分析涡旋光相位奇点位置与拓扑荷数对双涡旋光干涉图像的影响，将实验结果与理论值对比发现条纹倾斜角和宽度分别为0°和0.1714 mm时，两相位奇点像素位置分别为（351，251）和（151，251）、拓扑荷数为1的双涡旋光干涉图像测量偏差值最小，即两光束相位奇点位于图像中心且连线方向正交于条纹方向的低拓扑荷数双涡旋光干涉图像更适用于微测量领域。

To explore the influence of a double-vortex optical interference pattern on the precision of micromeasurement, a method to measure the characteristics of the self-interference pattern of an optical vortex is proposed based on the principle of double-vortex optical interference. In this paper, the factors affecting the interference image of two vortex beams are analyzed, and an optical system is designed and built to measure the characteristics of the double-vortex optical interference pattern with shear interferometry. By collecting the interference images after different displacements of the objects in the system under the same conditions and analyzing the effect of the positions of two vortex beams and the number of topological charges on the interference image with the method of image correlation processing, a conclusion can be drawn from the measured deviation of a double-vortex optical interferogram that the pixel positions of the two phase singularities are (351, 251) and (151, 251) and the topological charge is 1 as the minimum when the fringe angle and width are 0° and 0.1714 mm, respectively, from comparing the results with the theoretical value. It means that the double-vortex optical interference images with low topological charge and phase singularities located in the center of the image and the alignment direction orthogonal to the fringe direction are more suitable for micromeasurement.