为了研究硅基OLED(Organic Light Emitting Diodes)微显示器的使用寿命,通过老化实验提出一种基于恢复模型的OLED亮度衰减模型,该亮度衰减模型融合传统延伸型指数衰减模型与OLED亮度恢复模型。使用亮度退化数据拟合衰减模型中的待定参数,得到初始亮度和占空比与OLED寿命之间的定性和定量关系,实现OLED的高精度亮度衰减预测。研究结果表明,对比所提模型的预测数据与实测亮度衰减数据可得,所提模型的预测误差小,拟合精度高达99.22%,相同初始亮度驱动下OLED的寿命预测准确度可提高79.1%。PWM(Pulse-Width Modulation)驱动下硅基OLED微显示器的寿命性能较传统电流/电压驱动型优越,在12.5%~87.5%的占空比下,可延长1.6~20.9倍的硅基OLED微显示器寿命。

Through aging experiments, an organic light-emitting diode (OLED) luminance decay model based on a restoration model is proposed to study the lifetime of OLED-on-silicon microdisplays. The luminance decay model is a fusion of the traditional stretched exponential decay and OLED brightness restoration models. The brightness degradation data is used to fit the undetermined parameters in the attenuation model to obtain the qualitative and quantitative relationship between the initial brightness and duty cycle and the life of the OLED to realize the high-precision brightness attenuation prediction of the OLED. Comparing with the measured, it can be concluded that the prediction error of the proposed model is small, and the fitting accuracy is as high as 99.22%. Under the same initial brightness drive, the life prediction accuracy of OLED can be improved by 79.1%. The lifetime performance of OLED-on-silicon microdisplay driven by pulse-width modulation (PWM) is superior to that of traditional current/voltage driven types. At a duty ratio of 12.5%--87.5%, the lifetime of OLED-on-silicon microdisplays can be increased by 1.6--20.9 times.