激光与光电子学进展, 2013, 50 (4): 041203, 网络出版: 2013-03-22
一种基于偏振光干涉的原子力显微镜测头的研究
Gauging Head of Atomic Force Microscope Based on Interference of Polarized Light
补充材料
陈成, 高思田, 卢荣胜, 李伟. 一种基于偏振光干涉的原子力显微镜测头的研究[J]. 激光与光电子学进展, 2013, 50(4): 041203. Chen Cheng, Gao Sitian, Lu Rongsheng, Li Wei. Gauging Head of Atomic Force Microscope Based on Interference of Polarized Light[J]. Laser & Optoelectronics Progress, 2013, 50(4): 041203.