中国激光, 2018, 45 (1): 0103002, 网络出版: 2018-01-24
光刻曝光系统中新型光可变衰减器的研制 下载: 956次
Development of a Novel Optical Variable Attenuator in Lithography Exposure System
图 & 表
图 2. 新型光可变衰减器结构示意图。(a)二维结构;(b)三维结构
Fig. 2. Structure diagram of the new optical variable attenuator. (a) Two-dimensional structure; (b) three-dimensional structure
图 3. 衰减膜透射率与入射角的关系
Fig. 3. Relationship between transmittance of attenuation films and incident angle
图 4. 减反膜反射率与入射角的关系
Fig. 4. Relationship between reflectance of antireflective films and incident angle
图 5. 减反膜反射率与波长的关系
Fig. 5. Relationship between wavelength and reflectance of antireflective films
表 1193 nm波长常用的镀膜材料特性
Table1. Characteristic of common coating materials for 193 nm wavelength
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李美萱, 王丽, 董连和. 光刻曝光系统中新型光可变衰减器的研制[J]. 中国激光, 2018, 45(1): 0103002. Li Meixuan, Wang Li, Dong Lianhe. Development of a Novel Optical Variable Attenuator in Lithography Exposure System[J]. Chinese Journal of Lasers, 2018, 45(1): 0103002.