光学学报, 2008, 28 (5): 1007, 网络出版: 2008-05-20
沉积温度对氧化钇稳定氧化锆薄膜残余应力的影响
Influence of Deposition Temperature on Residual Stress of Yttria-Stabilized Zirconia Thin Films
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肖祁陵, 贺洪波, 邵淑英, 邵建达, 范正修. 沉积温度对氧化钇稳定氧化锆薄膜残余应力的影响[J]. 光学学报, 2008, 28(5): 1007. Xiao Qiling, He Hongbo, Shao Shuying, Shao Jianda, Fan Zhengxiu. Influence of Deposition Temperature on Residual Stress of Yttria-Stabilized Zirconia Thin Films[J]. Acta Optica Sinica, 2008, 28(5): 1007.