激光与光电子学进展, 2019, 56 (1): 011004, 网络出版: 2019-08-01
荧光成像技术探测熔石英元件亚表面缺陷 
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Subsurface Defects in Fused Silica Elements Detected by Fluorescence Imaging Technology
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李洪路, 刘红婕, 蒋晓东, 黄进, 曹林洪. 荧光成像技术探测熔石英元件亚表面缺陷[J]. 激光与光电子学进展, 2019, 56(1): 011004.
Honglu Li, Hongjie Liu, Xiaodong Jiang, Jin Huang, Linhong Cao. Subsurface Defects in Fused Silica Elements Detected by Fluorescence Imaging Technology[J]. Laser & Optoelectronics Progress, 2019, 56(1): 011004.
李洪路, 刘红婕, 蒋晓东, 黄进, 曹林洪. 荧光成像技术探测熔石英元件亚表面缺陷[J]. 激光与光电子学进展, 2019, 56(1): 011004. Honglu Li, Hongjie Liu, Xiaodong Jiang, Jin Huang, Linhong Cao. Subsurface Defects in Fused Silica Elements Detected by Fluorescence Imaging Technology[J]. Laser & Optoelectronics Progress, 2019, 56(1): 011004.
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