激光杂志, 2008, 29 (2): 66, 网络出版: 2008-08-17  

一种提高悬臂粱振动参数测量技术的研究

Study on vibration characteristic of cantilever in MEMS
作者单位
1 重庆大学,重庆,400030
2 重庆师范大学,重庆,400030
摘要
正弦相位调制干涉测量技术是一种高精度光学测量技术,可用于MEMS振动、振动分布、位移等物理量的测量.本文提出一种提高悬臂粱振动参数测量精度的方法,并分析了测量原理.该方法通过反馈控制回路消除了外界干扰和光强调制对测量精度的影响,并以纳米精度对悬臂粱的振动进行了检测,可得到悬臂粱在光激励下发生振动的相关振动特性参数.
Abstract
参考文献

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