With ultrafast laser systems reaching presently 10 PW peak power or operating at high repetition rates, research towards ensuring the long-term, trouble-free performance of all laser-exposed optical components is critical. Our work is focused on providing insight into the optical material behavior at fluences below the standardized laser-induced damage threshold (LIDT) value by implementing a simultaneous dual analysis of surface emitted particles using a Langmuir probe (LP) and the target current (TC). ${\mathrm{HfO}}_2$ and ${\mathrm{ZrO}}_2$ thin films deposited on fused silica substrates by pulsed laser deposition at various ${\mathrm{O}}_2$ pressures for defect and stoichiometry control were irradiated by Gaussian, ultrashort laser pulses (800 nm, 10 Hz, 70 fs) in a wide range of fluences. Both TC and LP collected signals were in good agreement with the existing theoretical description of laser–matter interaction at an ultrashort time scale. Our approach for an in situ LIDT monitoring system provides measurable signals for below-threshold irradiation conditions that indicate the endurance limit of the optical surfaces in the single-shot energy scanning mode. The LIDT value extracted from the LP-TC system is in line with the multipulse statistical analysis done with ISO 21254-2:2011(E). The implementation of the LP and TC as on-shot diagnostic tools for optical components will have a significant impact on the reliability of next-generation ultrafast and high-power laser systems.

在气压40~80 Pa和微波功率400~800 W条件下，使用光学发射光谱法（OES）对Ar、CH₄等气体产生的等离子体进行电子温度诊断。实验结果表明，OES法测试得到的电子温度介于0.75 eV到4 eV之间。在含碳气体的微波同轴线型等离子体中使用OES方法进行诊断是可行的，这些研究结果可以进一步拓展OES方法在等离子体增强化学气相沉积领域中的应用。